Krichevskiy, Sergey V.

2024

• 1 Kolpakov V.A., Krichevskiy S.V., Markushin M.A. Off-Electrode Plasma of High-Voltage Gas Discharge for Micro- and Nanotechnology Problems // Optical Memory and Neural Networks (Information Optics) 2024. — Vol. 33. Issue Suppl 2. № Suppl 2. — P. S320-S334

2020

• 1 Kolpakov V.A., Krichevskii S.V. Diffusion Mechanism in Aluminum–Silicon Structures Surface-Irradiated by Off-Electrode Plasma of a High-Voltage Gas Discharge // Technical Physics 2020. — Vol. 65. Issue 1. — P. 57-62
• 2 Markushin M.A., Kolpakov V.A., Krichevskii S.V. Specific Features of the Distribution of Nonuniform Electrostatic Field in a System with Variable Configuration of Electrodes That Generates High-Voltage Gas Discharge // Technical Physics 2020. — Vol. 65. Issue 12. — P. 1956-1962

2019

• 1 Markushin M.A., Kolpakov V.A., Krichevskiy S.V. Influence of electric field distribution on the charged particles kinetics of the off-electrode plasma formed by high-voltage gas discharge // Proceedings of SPIE - The International Society for Optical Engineering. — 2019. — Vol. 11146.

2017

• 1 Kolpakov V.A., Krichevskii S.V., Markushin M.A. Kinetics of charged particles in a high-voltage gas discharge in a nonuniform electrostatic field // Journal of Experimental and Theoretical Physics 2017. — Vol. 124. Issue 1. — P. 164-171
• 2 Markushin M.A., Kolpakov V.A., Krichevskiy S.V. Calculation of the electrostatic field distribution formed by the generator of the off-electrode plasma // CEUR Workshop Proceedings. — 2017. — Vol. 1904. — P. 93-99
• 3 Ivliev N.A., Kolpakov V.A., Kolpakov V.A. etc. Determination of organic contaminants concentration on the silica surface by lateral force microscopy // Приборостроение, электроника и телекоммуникации – 2016. — 2017. — P. 34-41
• 4 Ivliev N.A., Kolpakov V.A., Krichevskii S.V. etc. Determination of Concentration of Organic Contaminants on a Silicon Dioxide Surface by Tribometry // Measurement Techniques 2017. — P. 1-5
• 5 Ivliev N.A., Kolpakov V.A., Krichevskii S.V. etc. Determination of Concentration of Organic Contaminants on a Silicon Dioxide Surface by Tribometry // MEASUREMENT TECHNIQUES 2017. — Vol. 60. Issue 9. — P. 869-873
• 6 Kolpakov V.A., Krichevsky S.V., Podlipnov V.V. A resistive dynamic evaporator for multicomponent materials // Instruments and Experimental Techniques 2017. — Vol. 60. Issue 2. — P. 297-300
• 7 Markushin M.A., Kolpakov V.A., Krichevskiy S.V. Software for analysis of the process of formation of the catalytic mask in the off-electrode plasma // Proceedings of SPIE - The International Society for Optical Engineering. — 2017. — Vol. 10342.
• 8 Kazanskiy N.L., Kolpakov V.A., Krichevskiy S.V. etc. A gas-discharge plasma focuser // Instruments and Experimental Techniques 2017. — Vol. 60. Issue 5. — P. 748-751
• 9 Kazanskiy N.L., Kolpakov V.A., Krichevskiy S.V. etc. Simulations of dynamic resistive evaporation in a vacuum // Technical Physics 2017. — Vol. 62. Issue 10. — P. 1490-1495

2016

• 1 Ivliev N.A., Kolpakov V.A., Krichevskiy S.V. Determination of organic contaminants concentration on the silica surface by lateral force microscopy // Computer Optics 2016. — Vol. 40. Issue 6. — P. 837-843

2015

• 1 Kolpakov V.A., Krichevskiy S.V., Markushin M.A. A device for monitoring the distribution of particles of off-electrode high-voltage gas-discharge plasma over the stream cross section using the curved-cavity method // Instruments and Experimental Techniques 2015. — Vol. 58. Issue 5. — P. 653-656
• 2 Kolpakov V.A., Kolpakov A.I., Krichevskiy S.V. A multibeam generator of gas-discharge plasma // Instruments and Experimental Techniques 2015. — Vol. 58. Issue 5. — P. 683-686
• 3 Markushin M.A., Kolpakov V.A., Krichevskii S.V. etc. Simulation of the electric field distribution in the electrode system of a device forming a high-voltage gas discharge // Technical Physics 2015. — Vol. 60. Issue 3. — P. 376-380

2014

• 1 Kolpakov V.A., Kolpakov A.I., Krichevskii S.V. A source of a wide-aperture gas-discharge plasma flow // Instruments and Experimental Techniques 2014. — Vol. 57. Issue 2. — P. 147-154

2008

• 1 Kazanskiy N.L., Karpeev S.V., Kolpakov V.A. etc. Interaction of dielectric substrates in the course of tribometric assessment of the surface cleanliness // Optical Memory and Neural Networks (Information Optics) 2008. — Vol. 17. Issue 1. — P. 37-42
• 2 Kazanskiy N.L., Kolpakov V.A., Kolpakov A.I. etc. Parameter optimization of a tribometric device for rapid assessment of substrate surface cleanliness // Optical Memory and Neural Networks (Information Optics) 2008. — Vol. 17. Issue 2. — P. 167-172

2007

• 1 KAZANSKIY N.L., KOLPAKOV V. A., KOLPAKOV A.I. etc. Исследование особенностей трибометрического взаимодействия диэлектрических подложек при экспресс – контроле степени чистоты их поверхности // Computer Optics 2007. — № том 31, № 1. — P. 42-46

2006

• 1 Kazanskiy N.L., Kolpakov V.A., Kritchevskiy S.V. Simulating the process of dielectric substrate surface cleaning in high-voltage gas discharge plasma // Proceedings of SPIE - The International Society for Optical Engineering. — 2006. — Vol. 6260.

2005

• 1 KAZANSKIY N.L., KOLPAKOV V. A., KOLPAKOV A.I. etc. Оптимизация параметров устройства трибометрического измерения чистоты поверхности подложек // Computer Optics 2005. — № № 28. — P. 76-79
• 2 KAZANSKIY N.L., KOLPAKOV V. A., KRIChEVSKIY SERGEY VASILEVICh Моделирование процесса очистки поверхности диэлектрических подложек в плазме газового разряда высоковольтного типа // Computer Optics 2005. — № № 28. — P. 80-86

1995

• 1 Kolpakov V.A., Kolpakov A.I., Krichevskij S.V. A device for the express-control of the surface finish of dielectric substrates // Pribory i Tekhnika Eksperimenta 1995. — Issue 5. — P. 199-200