Piganov, Mikhail N.

2022

• 1 Meleshenko D.Yu., Piganov M.N. Analysis of features, types, causes and mechanisms of CMOS integrated circuits failures // XIX International Multidisciplinary Conference “Prospects and Key Tendencies of Science in Contemporary World”. — 2022. —

2021

• 1 Novomeyskiy D. N. , Piganov M.N. Mathematical model of the interaction of a torch discharge with film elements // Journal of Physics: Conference Series. — 2021. — Vol. 1745. Issue 1.

2019

• 1 Maklashov V. A. , Piganov M.N., Petrov M.V. Simulation of transition matrix and strip lines of microwave switch // Journal of Physics: Conference Series. — 2019. — Vol. 1368. Issue 4.
• 2 Stolbinskiy D.V., Denisyuk A.A., Piganov Mikhail Nikolaevich Reliability assessment of electronic component base // International Conference “Scientific research of the SCO countries: synergy and integration”. — 2019. — Pt. 2. — P. 134-144

2018

• 1 Kostin Aleksey Vladimirovich, Piganov M.N., Bozrikov Vadim Sergeevich Method of measurement of interference in the chains of the on-board equipment of spacecrafts and processing their results // Engineering Studies 2018. — Vol. 10. Issue 3 (2). — P. 536-543
• 2 Mishanov R.O., Piganov M.N. Technique of determining the set of informative parameters for the personal prediction of the quality and reliability of radio-electronic means // Engineering Studies 2018. — Vol. 10. Issue 3 (2). — P. 565-575
• 3 Tyulevin S. V. , Piganov M.N., Eranceva E.S. Methods of the learning experiment of bipolar microcircuits // IEEE International Conference on Power, Control, Signals and Instrumentation Engineering, ICPCSI 2017. — 2018. — P. 75-79
• 4 Piganov M.N., Novomeyskiy D. N. Modeling the process of fitting thick-film resistors by the method of flare discharge // Journal of Physics: Conference Series. — 2018. — Vol. 1096. Issue 1.
• 5 Piganov M., Kostin A., Bozrikov V. Algorithm of development of measures of complex protection OE S from ESD // AIP Conference Proceedings. — 2018. — Vol. 1952.
• 6 Maklashov V.A., Piganov M.N. Simulation of ultrawided and embedded multilayer RFfilters embedded in a printed circuit board // Journal of Physics: Conference Series. — 2018. — Vol. 1096. Issue 1.
• 7 Piganov M., Tyulevin S. V. , Erantseva E. Individual prognosis of quality indicators of space equipment elements // AIP Conference Proceedings. — 2018. — Vol. 1952.

2017

• 1 Piganov M.N., Nasedkin A.V., Shumskikh I.Yu. etc. Technology Research Testing of Electronic Components Based on Imported Chips. // 14th International Conference the Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) 2017. — 2017. — P. 412-416
• 2 Tyulevin S. V. , Piganov M.N., Erantseva E.S. Methods of bipolar microcircuits learning experiment // CEUR Workshop Proceedings. — 2017. — Vol. 1904. — P. 209-213
• 3 Kostin A.V., Bozrikov V.S., Piganov M.N. Modelling of software methods for spacecraft on-board equipment protection againts interferences caused by electro-static discharge // Сборник научных трудов "Современные проблемы радиоэлектроники". — 2017. — P. 730-734
• 4 Mishanov R.O., Tyulevin S.V., Shopin G.P. etc. Устройство для определения нагрузочной способности микросхем // Известия Самарского научного центра РАН 2017. — Vol. 19. № 1-2. — P. 420-423
• 5 Mishanov R. O. , Tyulevin S. V. , Piganov M.N. etc. Forecasting models generation of the electronic means quality // CEUR Workshop Proceedings. — 2017. — Vol. 1904. — P. 124-129

2016

• 1 Mishanov R.O., Piganov M.N. Исследовательские испытания интегральных микросхем // Известия Самарского научного центра РАН 2016. — Vol. 18. № 4 (7). — P. 1406-1409
• 2 Ivanov A.V., Piganov M.N. Оценка качества паяных соединений электронных узлов // Известия Самарского научного центра РАН 2016. — Vol. 18. № 4 (7). — P. 1381-1386
• 3 Pogorelov A.M., Piganov M.N. Общая методика диагностического контроля двойнослойных электрохимических конденсаторов // Известия Самарского научного центра РАН 2016. — Vol. 18. № 4 (7). — P. 1433-1436

2015

• 1 Piganov M., Tyulevin S. V. , Erantseva E. Individual prognosis of quality indicators of space equipment elements // Proceedings of 13th International Conference: The Experience of Designing and Application of CAD Systems in Microelectronics, CADSM 2015. — 2015. — P. 367-371
• 2 Mishanov R.O., TYuLEVIN S.V., Piganov M.N. ANALYSIS OF THE UNRELIABILITY REASONS AND THE DIAGNOSTIC NON-DESTRUCTIVE TESTING INSTALLATION FOR THE INTEGRATED STABILIZERS // SWorld Journal ISSN 2227-6920 2015. — № J11510-032. — P. 179-183
• 3 Piganov Mikhail, MIShANOV R. O. Индивидуальное прогнозирование стабилитронов и интегральных микросхем методом экстраполяции // ХIII Международная научно-техническая конференция The Experience of Designing and Application of CAD Systems in Microelectronics (IEEE UKRAINE SECTION ) CADSM 2015. — 2015. — P. 242-244
• 4 Piganov M.N., TYuLEVIN S.V., Mishanov R.O. DEVELOPMENT DIAGNOSTIC METHODS FOR NON-DESTRUCTIVE CONTROL CHIP // SWorld Journal ISSN 2227- 6920 2015. — № J11510-016. — P. 98-106
• 5 Mishanov R.O., Piganov M.N. Technology of Diagnostic for Non- dectructive Control of the Bipolar Integrated Circuits // 2nd International Scientific Symposium "Sense. Enable.SPITSE."2015 St.Petersburg,Russia IEEE. — 2015. — P. 38-41
• 6 Mishanov R. O. , Piganov M. Individual forecasting of quality characteristics by an extrapolation method for the samples of the stabilitrons and the integrated circuits // Proceedings of 13th International Conference: The Experience of Designing and Application of CAD Systems in Microelectronics, CADSM 2015. — 2015. — P. 242-244

2014

• 1 Piganov Mikhail Nikolaevich, Tyulevin S.V. Concept of quality management space radio electronic means // Modern Scientific Research аnd Their Practical Application 2014. — Vol. 21410 . — P. 19-24
• 2 Piganov Mikhail Nikolaevich, Tyulevin S.V., Eranceva E.S. etc. Diagnostic method for non-destructive control chip cmos -type // Modern Scientific Research аnd Their Practical Application 2014. — Vol. 21410 . — P. 154-161
• 3 Tyulevin S.V., Piganov Mikhail Nikolaevich, Shopin G.P. Fitting thick-film microassembly’s elements // Modern Scientific Research аnd Their Practical Application 2014. — Vol. 21410 . — P. 15-19
• 4 Piganov M.N., TYuLEVIN S.V., ERANCEVA E.S. etc. Fpparatus diagnostic for NON-DESTRUCTIVE CONTROL CHIP CMOS-TYRE // VIII INTERNATIONAL RESEARCH AND PRACTICE CONFERENCE "European Science and Technology". — 2014. — P. 398-401